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Title: Micrometer-Scale Machining of Metals and Polymers Enabled by Focused Ion Beam Sputtering

Conference ·
OSTI ID:2819

This work combines focused ion beam sputtering and ultra-precision machining for microfabrication of metal alloys and polymers. Specifically, micro-end mills are made by Ga ion beam sputtering of a cylindrical tool shank. Using an ion energy of 20keV, the focused beam defines the tool cutting edges that have submicrometer radii of curvature. We demonstrate 25 {micro}m diameter micromilling tools having 2, 4 and 5 cutting edges. These tools fabricate fine channels, 26-28 microns wide, in 6061 aluminum, brass, and polymethyl methacrylate. Micro-tools are structurally robust and operate for more than 5 hours without fracture.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
2819
Report Number(s):
SAND98-2843C; TRN: AH200112%%178
Resource Relation:
Conference: Materials Research Society Fall Meeting, Boston, MA (US), 11/30/1998--12/04/1998; Other Information: PBD: 22 Dec 1998
Country of Publication:
United States
Language:
English

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