Off-specular x-ray scattering studies of the morphology of thin films
Conference
·
OSTI ID:279697
- and others
We discuss the scattering of x-rays from thin films at a surface or interface decorated with a morphology of islands and how these effects manifest themselves in the specular reflectivity and the diffuse (off-specular) scattering. We show how this technique has been used to study block copolymer films decorated with islands on the surface and the development of electrochemically induced pitting on a Cu electrode in an electrolyte solution.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 279697
- Report Number(s):
- ANL/XFD/CP-90210; CONF-9605203-1; ON: DE96012803; TRN: 96:004926
- Resource Relation:
- Conference: Conference on colloids and interface science, Puerto Rico (Mexico), 3-5 May 1996; Other Information: PBD: Sep 1996
- Country of Publication:
- United States
- Language:
- English
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