skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Status and limitations of multilayer x-ray interference structures

Abstract

Trends in the performance of x-ray multilayer interference structures with periods ranging from 9 to 130 {angstrom} are reviewed. Analysis of near-normal incidence reflectance data vs photon energy reveals that the effective interface with {sigma} in a static Debye-Waller model, describing interdiffusion and roughness, decreases as the multilayer period decreases, and reaches a lower limit of roughly 2 {angstrom}. Specular reflectance and diffuse scattering from uncoated and multilayer-coated substrates having different roughness suggest that this lower limit results largely from substrate roughness. The increase in interface width with period thus results from increasing roughness of interdiffusion as the layer thickness increases.

Authors:
Publication Date:
Research Org.:
Lawrence Berkeley Lab., CA (US)
Sponsoring Org.:
USDOE, Washington, DC (US)
OSTI Identifier:
245555
Report Number(s):
LBL-38518; LSBL-319; CONF-9509134-2
ON: DE96011520; TRN: US0303515
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Conference
Resource Relation:
Conference: 2. international symposium on magnetic multilayers, Cambridge (GB), 09/11/1995--09/14/1995; Other Information: Supercedes report DE96011520; PBD: Mar 1996; PBD: 1 Mar 1996
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; DIFFUSE SCATTERING; PERFORMANCE; PHOTONS; ROUGHNESS; SUBSTRATES; THICKNESS; ADVANCED LIGHT SOURCE; ALS

Citation Formats

Kortright, J B. Status and limitations of multilayer x-ray interference structures. United States: N. p., 1996. Web.
Kortright, J B. Status and limitations of multilayer x-ray interference structures. United States.
Kortright, J B. 1996. "Status and limitations of multilayer x-ray interference structures". United States. https://www.osti.gov/servlets/purl/245555.
@article{osti_245555,
title = {Status and limitations of multilayer x-ray interference structures},
author = {Kortright, J B},
abstractNote = {Trends in the performance of x-ray multilayer interference structures with periods ranging from 9 to 130 {angstrom} are reviewed. Analysis of near-normal incidence reflectance data vs photon energy reveals that the effective interface with {sigma} in a static Debye-Waller model, describing interdiffusion and roughness, decreases as the multilayer period decreases, and reaches a lower limit of roughly 2 {angstrom}. Specular reflectance and diffuse scattering from uncoated and multilayer-coated substrates having different roughness suggest that this lower limit results largely from substrate roughness. The increase in interface width with period thus results from increasing roughness of interdiffusion as the layer thickness increases.},
doi = {},
url = {https://www.osti.gov/biblio/245555}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Mar 01 00:00:00 EST 1996},
month = {Fri Mar 01 00:00:00 EST 1996}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: