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Title: Optimization of plasma deposition and etching processes for commercial multicrystalline silicon solar cells

Conference ·
OSTI ID:244570
 [1]; ;  [2];  [3]; ;  [4]
  1. Sandia National Labs., Albuquerque, NM (United States)
  2. Univ. of New Mexico, Albuquerque, NM (United States)
  3. ASE Americas, Inc., Billerica, MA (United States)
  4. Solarex, Frederick, MD (United States)

The authors conducted an investigation of plasma deposition and etching processes on full-size multicrystalline (mc-Si) cells processed in commercial production lines, so that any improvements obtained will be immediately relevant to the PV industry. In one case, the authors performed a statistically designed multiparameter experiment to determine the optimum PECVD-nitride deposition conditions specific to EFG silicon from ASE Americas, Inc. In a related effort, they studied whether plasma-etching techniques can use standard screen-printed gridlines as etch masks to form self-aligned, patterned-emitter profiles on mc-Si cells from Solarex Corp. Initial results found a statistically significant improvement of about half an absolute percentage point in cell efficiency when the self-aligned emitter etchback was combined with the PECVD-nitride surface passivation treatment. Additional improvement is expected when the successful bulk passivation treatment is also added to the process.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
244570
Report Number(s):
SAND-95-2816C; CONF-960513-8; ON: DE96010976; TRN: AHC29613%%45
Resource Relation:
Conference: 25. photovoltaic solar energy conference, Washington, DC (United States), 13-17 May 1996; Other Information: PBD: [1996]
Country of Publication:
United States
Language:
English