Analysis of high-level radioactive slurries as a method to reduce DWPF turnaround times
Analysis of Defense Waste Processing Facility (DWPF) samples as slurries rather than as dried or vitrified samples is an effective way to reduce sample turnaround times. Slurries can be dissolved with a mixture of concentrated acids to yield solutions for elemental analysis by inductively coupled plasma-atomic emission spectroscopy (ICP-AES). Slurry analyses can be performed in eight hours, whereas analyses of vitrified samples require up to 40 hours to complete. Analyses of melter feed samples consisting of the DWPF borosilicate frit and either simulated or actual DWPF radioactive sludge were typically within a range of 3--5% of the predicted value based on the relative amounts of sludge and frit added to the slurry. The results indicate that the slurry analysis approach yields analytical accuracy and precision competitive with those obtained from analyses of vitrified samples. Slurry analyses offer a viable alternative to analyses of solid samples as a simple way to reduce analytical turnaround times.
- Research Organization:
- Savannah River Site (SRS), Aiken, SC (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC09-89SR18035
- OSTI ID:
- 244569
- Report Number(s):
- WSRC-MS-96-0219; CONF-9604124-8; ON: DE96011139; TRN: 96:014584
- Resource Relation:
- Conference: 98. annual meeting of the American Ceramic Society, Indianapolis, IN (United States), 14-17 Apr 1996; Other Information: PBD: [1996]
- Country of Publication:
- United States
- Language:
- English
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