Development of a scanning near-field infrared microscope based on a free electron laser
- Princeton Univ., NJ (United States)
- Stanford Univ., CA (United States)
Infrared spectroscopy is one of the most sensitive technique available for identifying and characterizing organic materials. Most molecules exhibit a large number of well-resolved strongly absorbing spectral lines in the mid-IR region of the spectrum. In addition to our own efforts described last year, Creuzet et al have also been working on combining infrared spectroscopy with sub-micron spatial resolution imaging. Scanning Near Field Infrared Microscopy (SNIM) when combined with high brightness tunable FEL radiation, provides a powerful new research tool. We have developed two new probes for use in SNIM. The first are chalcogenide fibers capable of transmitting images in the 2-12 {mu} range. At the Stanford picosecond Free Electron Laser, we have successfully obtained images of metal surfaces and of collagen fibers on diamond at a wavelength of 5.01 {mu}, with a nominal spatial resolution of 0.5 {mu} demonstrating that near field imaging can be obtained on biological samples. At a wavelength of 6.3{mu}, we found that the chalcogenide fibers are limited in their ability to withstand high powers, most likely because of the presence of absorption bands in the polyimide coating used to sheath the brittle fibers. In collaboration with Prof J. Harrington (Rutgers University), we have also developed hollow glass capillaries with metal coated on the inside. These probes are able to withstand significantly higher powers, and can function to longer wavelengths, out into the Far IR region.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- OSTI ID:
- 238885
- Report Number(s):
- BNL-61982-Absts.; CONF-9508156-Absts.; ON: DE96002729; TRN: 96:013378
- Resource Relation:
- Conference: 17. international free electron laser conference, New York, NY (United States), 21-25 Aug 1995; Other Information: PBD: [1995]; Related Information: Is Part Of 17th international free electron laser conference and 2nd international FEL users` workshop. Program and abstracts; PB: 300 p.
- Country of Publication:
- United States
- Language:
- English
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