skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Beam extraction experiment with field-emission arrays

Conference ·
 [1]; ;  [2]
  1. Fukuoka Institute of Technology (Japan)
  2. Japan Atomic Energy Research Institute, Ibaraki (Japan); and others

An experimental project aimed to develop FEL drivers using a field-emission array is under way. The subject covers design and fabrication of novel micro-emitters, operation of FEAs, beam formation and emittance diagnostics. So far the generation of a focused beam has been demonstrated with an array of double-gated microemitters. Active control of FEAs has greatly improved the stability of the emission current. Large FEAs with an emitting area of up to 2 x 2 cm{sup 2} have been fabricated for the production of high-current beams. DC beams (1 - 5 keV < 100 {mu}A) extracted from Spindt cathodes were propagated over 1 m and projected on a fluorescent screen. Separate images of FEA tips were observed and emittance measurement has been carried out. The cathode is going to be replaced by a double-gated FEA to improve the beam quality. Pulsed extraction of high currents will also be tested, employing a non-gated FEA as the cathode of a 1 MV induction linac. Results of these experiments will be presented and perspectives concerning the FEA gun will be discussed.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
OSTI ID:
238729
Report Number(s):
BNL-61982-Absts.; CONF-9508156-Absts.; ON: DE96002729; TRN: 96:013218
Resource Relation:
Journal Volume: 375; Journal Issue: 1-3; Conference: 17. international free electron laser conference, New York, NY (United States), 21-25 Aug 1995; Other Information: PBD: [1995]; Related Information: Is Part Of 17th international free electron laser conference and 2nd international FEL users` workshop. Program and abstracts; PB: 300 p.
Country of Publication:
United States
Language:
English

Similar Records

Electron emission distribution from a single Spindt-type field emitter
Conference · Tue Dec 31 00:00:00 EST 1996 · OSTI ID:238729

Field emitter array analysis for the design of inductive output amplifiers
Conference · Sun Dec 31 00:00:00 EST 1995 · OSTI ID:238729

Fabrication of double-gated Si field emitter arrays for focused electron beam generation
Journal Article · Fri Sep 01 00:00:00 EDT 1995 · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena · OSTI ID:238729