A novel optical scattering collection system for particulate monitoring applications
- Oak Ridge National Lab., TN (United States)
- Environmental Systems Corp., Knoxville, TN (United States)
Light collecting systems often require radically different optical surfaces than those commonly found in optical imaging systems. An optical particulate monitor must probe a volume in emission stacks to obtain a good statistical distribution of suspended particles. However, ideal imaging systems map object planes into conjugate image planes and can probe only small volumes. The authors describe the design, fabrication and performance of a novel optical scattering collection system that exploits precision-engineered reflective conical surfaces (axicons) in a telescopic arrangement that maps a line in object space onto the detector plane in image space. Such non-spherical surfaces are nearly impossible to fabricate using traditional methods, but can readily be made using the deterministic method of single-point diamond turning. In addition to complex optical surfaces, single-point diamond turning also makes possible the precision engineering of reference surfaces useful for built-in alignment of multiple surfaces and rapid assembly of the finished system.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 231421
- Report Number(s):
- CONF-960522-1; ON: DE96009886; TRN: AHC29611%%67
- Resource Relation:
- Conference: 42. international instrumentation symposium, San Diego, CA (United States), 5-9 May 1996; Other Information: PBD: [1996]
- Country of Publication:
- United States
- Language:
- English
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