Sub microsecond notching of a negative hydrogen beam at low energy utilizing a magnetron ion source with a split extractor

Conference · Wed Dec 01 00:00:00 EST 2004 · AIP Conf.Proc.763:189-193,2005

OSTI ID:15017320

Moehs, Douglas

A technique for sub-microsecond beam notching is being developed at 20 keV utilizing a Magnetron ion source with a slit extraction system and a split extractor. Each half of the extractor is treated as part of a 50 ohm transmission line which can be pulsed at {+-}700 volts creating a 1400 volt gradient. This system along with the associated electronics is electrically floated on top of a pulsed extraction voltage. A beam reduction of 95% has been observed at the end of the Fermilab 400 MeV Linac and 35% notching has recently been achieved in the Booster.

• Research Organization: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-76CH03000
• OSTI ID: 15017320
• Report Number(s): FERMILAB-CONF-04-383-AD; TRN: US0605200
• Journal Information: AIP Conf.Proc.763:189-193,2005, Journal Name: AIP Conf.Proc.763:189-193,2005
• Country of Publication: United States
• Language: English

Related Subjects

08 HYDROGEN
24 POWER TRANSMISSION AND DISTRIBUTION
43 PARTICLE ACCELERATORS
FERMILAB
HYDROGEN
ION SOURCES
LINEAR ACCELERATORS
MAGNETRONS
POWER TRANSMISSION LINES
Accelerators