Quantifying the Sensitivity of Superconducting High-Resolution X-Ray Spectrometers
Journal Article
·
· Physica Status Solidi (c)
OSTI ID:15016759
Superconducting tunnel junction (STJ) X-ray spectrometers have been developed for synchrotron-based high-resolution soft X-ray spectroscopy. We are quantifying the improvements in sensitivity that STJ spectrometers can offer for the analysis of dilute specimens over conventional semiconductor and grating spectrometers. We present analytical equations to quantify the improvements in terms of spectrometer resolution, detection efficiency and count rate capabilities as a function of line separation and spectral background. We discuss the implications of this analysis for L-edge spectroscopy of first-row transition metals.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 15016759
- Report Number(s):
- UCRL-JRNL-207045; TRN: US200516%%35
- Journal Information:
- Physica Status Solidi (c), Vol. 2, Issue 5
- Country of Publication:
- United States
- Language:
- English
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