Characterization and Compensation of High Speed Digitizers
Abstract
Increasingly, ADC technology is being pressed into service for single single-shot instrumentation applications that were formerly served by vacuum-tube based oscilloscopes and streak cameras. ADC technology, while convenient, suffers significant performance impairments. Thus, in these demanding applications, a quantitative and accurate representation of these impairments is critical to an understanding of measurement accuracy. We have developed a phase-plane behavioral model, implemented it in SIMULINK and applied it to interleaved, high-speed ADCs (up to 4 gigasamples/sec). We have also developed and demonstrated techniques to effectively compensate for these impairments based upon the model.
- Authors:
- Publication Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- US Department of Energy (US)
- OSTI Identifier:
- 15016329
- Report Number(s):
- UCRL-PROC-211090
TRN: US200513%%135
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Conference
- Resource Relation:
- Journal Volume: 1; Conference: Presented at: IMTC 2005 Instrumentation and Measurement Technology Conference, Ottawa, Ontario (CA), 05/17/2005--05/19/2005; Other Information: PBD: 4 Apr 2005
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ACCURACY; DIGITIZERS; PERFORMANCE; STREAK CAMERAS; VELOCITY
Citation Formats
Fong, P, Teruya, A, and Lowry, M. Characterization and Compensation of High Speed Digitizers. United States: N. p., 2005.
Web. doi:10.1109/IMTC.2005.1604149.
Fong, P, Teruya, A, & Lowry, M. Characterization and Compensation of High Speed Digitizers. United States. https://doi.org/10.1109/IMTC.2005.1604149
Fong, P, Teruya, A, and Lowry, M. 2005.
"Characterization and Compensation of High Speed Digitizers". United States. https://doi.org/10.1109/IMTC.2005.1604149. https://www.osti.gov/servlets/purl/15016329.
@article{osti_15016329,
title = {Characterization and Compensation of High Speed Digitizers},
author = {Fong, P and Teruya, A and Lowry, M},
abstractNote = {Increasingly, ADC technology is being pressed into service for single single-shot instrumentation applications that were formerly served by vacuum-tube based oscilloscopes and streak cameras. ADC technology, while convenient, suffers significant performance impairments. Thus, in these demanding applications, a quantitative and accurate representation of these impairments is critical to an understanding of measurement accuracy. We have developed a phase-plane behavioral model, implemented it in SIMULINK and applied it to interleaved, high-speed ADCs (up to 4 gigasamples/sec). We have also developed and demonstrated techniques to effectively compensate for these impairments based upon the model.},
doi = {10.1109/IMTC.2005.1604149},
url = {https://www.osti.gov/biblio/15016329},
journal = {},
number = ,
volume = 1,
place = {United States},
year = {Mon Apr 04 00:00:00 EDT 2005},
month = {Mon Apr 04 00:00:00 EDT 2005}
}
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