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Title: Characterization and Compensation of High Speed Digitizers

Abstract

Increasingly, ADC technology is being pressed into service for single single-shot instrumentation applications that were formerly served by vacuum-tube based oscilloscopes and streak cameras. ADC technology, while convenient, suffers significant performance impairments. Thus, in these demanding applications, a quantitative and accurate representation of these impairments is critical to an understanding of measurement accuracy. We have developed a phase-plane behavioral model, implemented it in SIMULINK and applied it to interleaved, high-speed ADCs (up to 4 gigasamples/sec). We have also developed and demonstrated techniques to effectively compensate for these impairments based upon the model.

Authors:
; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
15016329
Report Number(s):
UCRL-PROC-211090
TRN: US200513%%135
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Journal Volume: 1; Conference: Presented at: IMTC 2005 Instrumentation and Measurement Technology Conference, Ottawa, Ontario (CA), 05/17/2005--05/19/2005; Other Information: PBD: 4 Apr 2005
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ACCURACY; DIGITIZERS; PERFORMANCE; STREAK CAMERAS; VELOCITY

Citation Formats

Fong, P, Teruya, A, and Lowry, M. Characterization and Compensation of High Speed Digitizers. United States: N. p., 2005. Web. doi:10.1109/IMTC.2005.1604149.
Fong, P, Teruya, A, & Lowry, M. Characterization and Compensation of High Speed Digitizers. United States. https://doi.org/10.1109/IMTC.2005.1604149
Fong, P, Teruya, A, and Lowry, M. 2005. "Characterization and Compensation of High Speed Digitizers". United States. https://doi.org/10.1109/IMTC.2005.1604149. https://www.osti.gov/servlets/purl/15016329.
@article{osti_15016329,
title = {Characterization and Compensation of High Speed Digitizers},
author = {Fong, P and Teruya, A and Lowry, M},
abstractNote = {Increasingly, ADC technology is being pressed into service for single single-shot instrumentation applications that were formerly served by vacuum-tube based oscilloscopes and streak cameras. ADC technology, while convenient, suffers significant performance impairments. Thus, in these demanding applications, a quantitative and accurate representation of these impairments is critical to an understanding of measurement accuracy. We have developed a phase-plane behavioral model, implemented it in SIMULINK and applied it to interleaved, high-speed ADCs (up to 4 gigasamples/sec). We have also developed and demonstrated techniques to effectively compensate for these impairments based upon the model.},
doi = {10.1109/IMTC.2005.1604149},
url = {https://www.osti.gov/biblio/15016329}, journal = {},
number = ,
volume = 1,
place = {United States},
year = {Mon Apr 04 00:00:00 EDT 2005},
month = {Mon Apr 04 00:00:00 EDT 2005}
}

Conference:
Other availability
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