Surface Analysis of Stressed and Control Tin Oxide Thin Films on Soda Lime Glass
Surface analysis techniques have been used to investigate tin oxide-coated soda lime glass specimens prior and subsequent to their exposure to DC bias, heat, and humidity. All specimens reported here comprise the following layered structure: tin oxide/silicon oxycarbide/glass. Depth profiling using X-ray photoelectron spectroscopy (XPS) clearly shows the interfacial regions in both control samples and samples exposed to the above-mentioned conditions (stressed). Control samples show distinct and relatively compact interfacial regions as well as an intact silicon oxycarbide diffusion barrier. Stressed films, however, show more diffuse interfacial regions and a physically and chemically altered silicon oxycarbide diffusion barrier. This deterioration of the diffusion barrier is proposed to be a pre-requisite event to enable tin oxide delamination.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC36-99-GO10337
- OSTI ID:
- 15004279
- Report Number(s):
- NREL/CP-520-33602; TRN: US201015%%464
- Resource Relation:
- Conference: Presented at the National Center for Photovoltaics and Solar Program Review Meeting, 24-26 March 2003, Denver, Colorado
- Country of Publication:
- United States
- Language:
- English
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