Stable a-Si:H-Based Multijunction Solar Cells with Guidance from Real-Time Optics: Final Report, 17 July 1998--16 November 2001
This report describes the new insights obtained into the growth of hydrogenated silicon (Si:H) films via real-time spectroscopic ellipsometry (RTSE) measurements. Evolutionary phase diagrams were expanded to include the effects of different deposition conditions, including rf power, pressure, and temperature. Detailed studies of degradation kinetics in thin films and corresponding solar cells have been carried out. Both p-i-n and n-i-p solar cells that incorporate Si:H i-layers deposited with and without H2-dilution have been studied. For the first time, direct and reliable correlations have been obtained between the light-induced changes in thin-film materials and the degradation of the corresponding solar cells.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC36-99-GO10337
- OSTI ID:
- 15000849
- Report Number(s):
- NREL/SR-520-32692; XAF-8-17619-22; TRN: US200401%%283
- Resource Relation:
- Other Information: PBD: 1 Aug 2002; Related Information: Work performed by The Pennsylvania State University, University Park, Pennsylvania
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
DEPOSITION
ELLIPSOMETRY
KINETICS
OPTICS
PHASE DIAGRAMS
SILICON
SOLAR CELLS
THIN FILMS
PV
REAL-TIME SPECTROSCOPIC ELLIPSOMETRY (RTSE)
PLASMA-ENHANCED CHEMICAL VAPOR DEPOSITION (PECVD)
AMORPHOUS SILICON
DEGRADATION KINETICS
HIGH RATE GROWTH
SUN ILLUMINATION
MIXED-PHASE-OPTIMIZATION MICROCRYSTALLINE MATERIALS
HYDROGEN DILUTION
REAL-TIME OPTICS
SOLAR ENERGY - PHOTOVOLTAICS