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Title: Extending the range of turbidity measurement using polarimetry

Patent ·
OSTI ID:1410283

Turbidity measurements are obtained by directing a polarized optical beam to a scattering sample. Scattered portions of the beam are measured in orthogonal polarization states to determine a scattering minimum and a scattering maximum. These values are used to determine a degree of polarization of the scattered portions of the beam, and concentrations of scattering materials or turbidity can be estimated using the degree of polarization. Typically, linear polarizations are used, and scattering is measured along an axis that orthogonal to the direction of propagation of the polarized optical beam.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Number(s):
9,823,183
Application Number:
14/855,307
OSTI ID:
1410283
Resource Relation:
Patent File Date: 2015 Sep 15
Country of Publication:
United States
Language:
English

References (14)

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Particle size analysis utilizing polarization intensity differential scattering patent April 1992
Method and apparatus for detection, analysis and identification of particles patent May 1996
Apparatus and process for the non-invasive measurement of optically active compounds patent August 1998
Instrument for determining static and/or dynamic light scattering patent September 2000
Focused laser light turbidity sensor patent May 2003
Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation patent April 2004
Method and system for the polarmetric analysis of scattering media utilising polarization difference sensing (PDS) patent June 2011
Particle characterization device patent January 2014
Chlorophyll and turbidity sensor system patent February 2014
Method And System For The Polarmetric Analysis Of Scattering Media Utilising Polarization Difference Sensing (PDS) patent-application March 2009
Particle Characterization Device patent-application July 2011
Method For Using Polarization Gating To Measure A Scattering Sample patent-application February 2014
Mueller matrix decomposition for extraction of individual polarization parameters from complex turbid media exhibiting multiple scattering, optical activity, and linear birefringence journal January 2008

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