Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle

Huang, Xian-Rong; Peng, Ru-Wen; Gog, Thomas; Siddons, D. P.; Assoufid, Lahsen

doi:10.1063/1.4901046

Title: Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle

Journal Article · Tue Nov 04 00:00:00 EST 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4901046· OSTI ID:1392293

Huang, Xian-Rong ^[1]; Peng, Ru-Wen ^[2]; Gog, Thomas ^[1]; Siddons, D. P. ^[3]; Assoufid, Lahsen ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)
Nanjing Univ. (China)
Brookhaven National Lab. (BNL), Upton, NY (United States)

Based on rigorous dynamical-theory calculations, we demonstrate in this paper the principle of an x-ray multiple-beam diffraction (MBD) scheme that overcomes the long-lasting difficulties of high-resolution in-plane diffraction from crystal surfaces. This scheme only utilizes symmetric reflection geometry with large incident angles but activates the out-of-plane and in-plane diffraction processes simultaneously and separately in the continuous MBD planes. The in-plane diffraction is realized by detoured MBD, where the intermediate diffracted waves propagate parallel to the surface, which corresponds to an absolute Bragg surface diffraction configuration that is extremely sensitive to surface structures. Finally, a series of MBD diffraction and imaging techniques may be developed from this principle to study surface/interface (misfit) strains, lateral nanostructures, and phase transitions of a wide range of (pseudo)cubic crystal structures, including ultrathin epitaxial films and multilayers, quantum dots, strain-engineered semiconductor or (multi)ferroic materials, etc.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States); Brookhaven National Lab. (BNL), Upton, NY (United States); Nanjing Univ. (China)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Ministry of Science and Technology (MOST) (China); National Natural Science Foundation of China (NSFC)

Grant/Contract Number:: AC02-06CH11357; AC02-98CH10886; 2012CB921502; 2010CB630705; 11034005; 61475070; 91321312

OSTI ID:: 1392293

Alternate ID(s):: OSTI ID: 1224272

Journal Information:: Applied Physics Letters, Vol. 105, Issue 18; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 4 works

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References (16)

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Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans dos Santos, Adenilson O.; Lang, Rossano; Sasaki, José M. Journal of Applied Crystallography, Vol. 52, Issue 6 https://doi.org/10.1107/s1600576719011944	journal	October 2019

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36 MATERIALS SCIENCE
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