High current table-top setup for femtosecond gas electron diffraction

Zandi, Omid; Wilkin, Kyle J.; Xiong, Yanwei; Centurion, Martin

doi:10.1063/1.4983225

Title: High current table-top setup for femtosecond gas electron diffraction

Journal Article · Mon May 08 00:00:00 EDT 2017 · Structural Dynamics

DOI:https://doi.org/10.1063/1.4983225· OSTI ID:1374554

Zandi, Omid ^[1]; Wilkin, Kyle J. ^[1]; Xiong, Yanwei ^[1]; Centurion, Martin ^[1]

Univ. of Nebraska, Lincoln, NE (United States). Dept. of Physics and Astronomy

Here, we have constructed an experimental setup for gas phase electron diffraction with femtosecond resolution and a high average beam current. While gas electron diffraction has been successful at determining molecular structures, it has been a challenge to reach femtosecond resolution while maintaining sufficient beam current to retrieve structures with high spatial resolution. The main challenges are the Coulomb force that leads to broadening of the electron pulses and the temporal blurring that results from the velocity mismatch between the laser and electron pulses as they traverse the sample. We also present here a device that uses pulse compression to overcome the Coulomb broadening and deliver femtosecond electron pulses on a gas target. The velocity mismatch can be compensated using laser pulses with a tilted intensity front to excite the sample. The temporal resolution of the setup was determined with a streak camera to be better than 400 fs for pulses with up to half a million electrons and a kinetic energy of 90 keV. Finally, the high charge per pulse, combined with a repetition rate of 5 kHz, results in an average beam current that is between one and two orders of magnitude higher than previously demonstrated.

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Research Organization:: Univ. of Nebraska, Lincoln, NE (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0014170

OSTI ID:: 1374554

Journal Information:: Structural Dynamics, Vol. 4, Issue 4; ISSN 2329-7778

Publisher:: American Crystallographic Association/AIPCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 22 works

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