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Title: Analyzing Single Giant Unilamellar Vesicles With a Slotline-Based RF Nanometer Sensor

Journal Article · · IEEE Transactions on Microwave Theory and Techniques
 [1];  [2];  [3];  [4];  [4];  [1]
  1. Clemson Univ., SC (United States). Dept. of Electrical and Computer Engineering
  2. Vanderbilt Univ., Nashville, TN (United States). Dept. of Molecular Physiology and Biophysics
  3. Johns Hopkins Univ., Baltimore, MD (United States). Dept. of Biology
  4. Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials

Novel techniques that enable reagent free detection and analysis of single cells are of great interest for the development of biological and medical sciences, as well as point-of-care health service technologies. Highly sensitive and broadband RF sensors are promising candidates for such a technique. In this paper, we present a highly sensitive and tunable RF sensor, which is based on interference processes and built with a 100-nm slotline structure. The highly concentrated RF fields, up to ~ 1.76×107 V/m, enable strong interactions between giant unilamellar vesicles (GUVs) and fields for high-sensitivity operations. We also provide two modeling approaches to extract cell dielectric properties from measured scattering parameters. GUVs of different molecular compositions are synthesized and analyzed with the RF sensor at ~ 2, ~ 2.5, and ~ 2.8 GHz with an initial |S21|min of ~ -100 dB. Corresponding GUV dielectric properties are obtained. Finally, a one-dimensional scanning of single GUV is also demonstrated.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States); Clemson Univ., SC (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Inst. of Health (NIH) (United States)
Contributing Organization:
Johns Hopkins Univ., Baltimore, MD (United States); Vanderbilt Univ., Nashville, TN (United States)
Grant/Contract Number:
AC02-06CH11357; 1K25GM100480-01A1
OSTI ID:
1339262
Journal Information:
IEEE Transactions on Microwave Theory and Techniques, Vol. 64, Issue 4; ISSN 0018-9480
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 6 works
Citation information provided by
Web of Science