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Title: Electrochemical force microscopy

Abstract

A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.

Inventors:
; ; ;
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1338917
Patent Number(s):
9,541,576
Application Number:
14/810,605
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Jul 28
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Kalinin, Sergei V., Jesse, Stephen, Collins, Liam F., and Rodriguez, Brian J. Electrochemical force microscopy. United States: N. p., 2017. Web.
Kalinin, Sergei V., Jesse, Stephen, Collins, Liam F., & Rodriguez, Brian J. Electrochemical force microscopy. United States.
Kalinin, Sergei V., Jesse, Stephen, Collins, Liam F., and Rodriguez, Brian J. 2017. "Electrochemical force microscopy". United States. https://www.osti.gov/servlets/purl/1338917.
@article{osti_1338917,
title = {Electrochemical force microscopy},
author = {Kalinin, Sergei V. and Jesse, Stephen and Collins, Liam F. and Rodriguez, Brian J.},
abstractNote = {A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.},
doi = {},
url = {https://www.osti.gov/biblio/1338917}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 10 00:00:00 EST 2017},
month = {Tue Jan 10 00:00:00 EST 2017}
}

Works referenced in this record:

Scanning probe potentiometer
patent, December 1999


Method for analyzing sample in liquid
patent, October 2011


Bias-Dependent Molecular-Level Structure of Electrical Double Layer in Ionic Liquid on Graphite
journal, November 2013


Double Layer Structure of Ionic Liquids at the Au(111) Electrode Interface: An Atomic Force Microscopy Investigation
journal, March 2011


Atomic force microscopy of local compliance at solid—liquid interfaces
journal, June 1994


In situ electrochemical studies of lithium-ion battery cathodes using atomic force microscopy
journal, March 2014