Nanoscale mapping of electromechanical response in ionic conductive ceramics with piezoelectric inclusions

Seol, Daehee; Seo, Hosung; Jesse, Stephen; Kim, Yunseok

doi:10.1063/1.4927813

Title: Nanoscale mapping of electromechanical response in ionic conductive ceramics with piezoelectric inclusions

Journal Article · Wed Aug 19 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4927813· OSTI ID:1337834

Seol, Daehee ^[1]; Seo, Hosung ^[1]; Jesse, Stephen ^[2]; Kim, Yunseok ^[1]

Sungkyunkwan Univ., Suwon (South Korea)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Electromechanical (EM) response in ion conductive ceramics with piezoelectric inclusions was spatially explored using strain-based atomic force microscopy. Since the sample is composed of two dominant phases of ionic and piezoelectric phases, it allows us to explore two different EM responses of electrically induced ionic response and piezoresponse over the same surface. Furthermore, EM response of the ionic phase, i.e., electrochemical strain, was quantitatively investigated from the comparison with that of the piezoelectric phase, i.e., piezoresponse. Finally, these results could provide additional information on the EM properties, including the electrochemical strain at nanoscale.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1337834

Journal Information:: Journal of Applied Physics, Vol. 118, Issue 7; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 17 works

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