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Title: Diffraction properties of multilayer Laue lenses with an aperture of 102 µm and WSi2/Al bilayers

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/OE.23.027990· OSTI ID:1335399
 [1];  [2];  [3];  [4];  [4];  [5];  [5];  [5];  [5];  [5];  [5]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division; Fraunhofer Institute for Material and Beam Technology, Dresden (Germany)
  2. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division; European XFEL GmbH, Hamburg (Germany)
  3. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division; Brookhaven National Lab. (BNL), Upton, NY (United States)
  4. Brookhaven National Lab. (BNL), Upton, NY (United States)
  5. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division
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Here, we report on the characterization of a multilayer Laue lens (MLL) with large acceptance, made of a novel WSi2/Al bilayer system. Fabrication of multilayers with large deposition thickness is required to obtain MLL structures with sufficient apertures capable of accepting the full lateral coherence length of x-rays at typical nanofocusing beamlines. To date, the total deposition thickness has been limited by stress-buildup in the multilayer. We were able to grow WSi2/Al with low grown-in stress, and asses the degree of stress reduction. X-ray diffraction experiments were conducted at beamline 1-BM at the Advanced Photon Source. We used monochromatic x-rays with a photon energy of 12 keV and a bandwidth of ΔE/E=5.4 ∙ 10-4. The MLL was grown with parallel layer interfaces, and was designed to have a large focal length of 9.6 mm. The mounted lens was 2.7 mm in width. We found and quantified kinks and bending of sections of the MLL. Sections with bending were found to partly have a systematic progression in the interface angles. We also observed kinking in some, but not all, areas. The measurements are compared with dynamic diffraction calculations made with Coupled Wave Theory. Finally our data are plotted showing the diffraction efficiency as a function of the external tilting angle of the entire mounted lens. This way of plotting the data was found to provide an overview into the diffraction properties of the whole lens, and enabled the following layer tilt analyses.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC00112704
OSTI ID:
1335399
Report Number(s):
BNL-111840-2016-JA; OPEXFF
Journal Information:
Optics Express, Vol. 23, Issue 21; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

References (22)

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Cited By (1)

Multilayer Laue Lens: A Brief History and Current Status journal July 2016

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36 MATERIALS SCIENCE