A multi-cone x-ray imaging Bragg crystal spectrometer

Journal Article · Fri Aug 26 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4960537· OSTI ID:1329249

Bitter, M. ^[1]; Hill, K. W. ^[1]; Gao, Lan ^[1]; Efthimion, P. C. ^[1]; Delgado-Apariccio, L. ^[1]; Lazerson, S.  ^[1]; Pablant, N. ^[1]

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1. Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)

This article describes a new x-ray imaging Bragg crystal spectrometer, which—in combination with a streak camera or a gated strip detector—can be used for time-resolved measurements of x-ray line spectra at the National Ignition Facility and other high power laser facilities. The main advantage of this instrument is that it produces perfect images of a point source for each wavelength in a selectable spectral range and that the detector plane can be perpendicular to the crystal surface or inclined by an arbitrary angle with respect to the crystal surface. Furthermore, these unique imaging properties are obtained by bending the x-ray diffracting crystal into a certain shape, which is generated by arranging multiple cones with different aperture angles on a common nodal line.

• Research Organization: Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
• Sponsoring Organization: USDOE
• Grant/Contract Number: AC02-09CH11466
• OSTI ID: 1329249
• Report Number(s): 5265; RSINAK; TRN: US1700166
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 11; ISSN 0034-6748
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
image sensors
X-ray imaging
X-ray spectrometers
X-ray detectors
X-ray lasers