An in situ high voltage electron microscopy technique for the study of deformation and fracture: In multilayered materials

Technical Report · Fri Apr 14 00:00:00 EDT 1995

DOI:https://doi.org/10.2172/132767· OSTI ID:132767

Wall, M A; Barbee, Jr, T W; Weihs, T P ^[1]

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1. Lawrence Livermore National Lab., CA (United States). Chemistry and Materials Science Dept.

A novel, in situ, high voltage electron microscopy technique for the direct observation of the micromechanisms of tensile deformation and fracture in nanostructured materials is detailed. This technique is particularly well suited for the dynamic observations of deformation and fracture in multilayered materials. The success of this type of in situ technique is highly dependent upon unique specimen preparation procedures and sample design, the importance thereof will be discussed. The initial observations discussed here are expected to aid in the understanding of the mechanical behavior of this new class of atomically engineered materials.

• Research Organization: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 132767
• Report Number(s): UCRL-JC-118958; CONF-950412-57; ON: DE96002140; TRN: AHC29529%%130
• Resource Relation: Conference: Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 17-21 Apr 1995; Other Information: PBD: 14 Apr 1995
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COMPOSITE MATERIALS
ELECTRON MICROSCOPY
FRACTURE PROPERTIES
DEFORMATION
COPPER
ZIRCONIUM
EXPERIMENTAL DATA
CRACK PROPAGATION
SAMPLE PREPARATION