Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films

Singh, Surendra; Freeland, J. W.; Fitzsimmons, Michael R.; Jeen, H.; Biswas, A.

doi:10.1038/srep29632

Title: Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films

Journal Article · Wed Jul 27 00:00:00 EDT 2016 · Scientific Reports

DOI:https://doi.org/10.1038/srep29632· OSTI ID:1286933

Singh, Surendra ^[1]; Freeland, J. W. ^[2]; Fitzsimmons, Michael R. ^[3]; Jeen, H. ^[4]; Biswas, A. ^[5]

Bhabha Atomic Research Centre (BARC), Mumbai (India)
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Florida, Gainesville, FL (United States); Pusan National Univ., Busan (Korea, Republic of)
Univ. of Florida, Gainesville, FL (United States)

Mixed-valence manganese oxides present striking properties like the colossal magnetoresistance, metal-insulator transition (MIT) that may result from coexistence of ferromagnetic, metallic and insulating phases. Percolation of such phase coexistence in the vicinity of MIT leads to first-order transition in these manganites. However the length scales over which the electronic and magnetic phases are separated across MIT which appears compelling for bulk systems has been elusive in (La_1-yPr_y)_1-xCa_xMnO₃ films. Here we show the in-plane length scale over which charge and magnetism are correlated in (La_0.4Pr_0.6)_1-xCa_xMnO₃ films with x=0.33 and 0.375, across the MIT temperature. We combine electrical transport (resistance) measurements, x-ray absorption spectroscopy (XAS), x-ray magnetic circular dichroism (XMCD), and specular/off-specular x-ray resonant magnetic scattering (XRMS) measurements as a function of temperature to elucidate relationships between electronic, magnetic and morphological structure of the thin films. Using off-specular XRMS we obtained the charge-charge and charge-magnetic correlation length of these LPCMO films across the MIT. We observed different charge-magnetic correlation length for two films which increases below the MIT. In conclusion, the different correlation length shown by two films may be responsible for different macroscopic (transport and magnetic) properties.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Laboratory Directed Research and Development (LDRD) Program; National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division

Grant/Contract Number:: AC05-00OR22725; AC02-06CH11357

OSTI ID:: 1286933

Alternate ID(s):: OSTI ID: 1326847

Journal Information:: Scientific Reports, Vol. 6; ISSN 2045-2322

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 5 works

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