Characterization of LiMn2O4 cathodes by electrochemical strain microscopy
- Ural Federal Univ., Ekaterinburg (Russia). Inst. of Natural Sciences
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Inst. for Functional Imaging of Materials
- Univ. of Aveiro (Portugal). Physics Dept. and CICECO-Aveiro Inst. of Materials
- Ural Federal Univ., Ekaterinburg (Russia). Inst. of Natural Sciences; Univ. of Aveiro (Portugal). Physics Dept. and CICECO-Aveiro Inst. of Materials
Electrochemical strain microscopy (ESM) is a scanning probe microscopy(SPM) method in which the local electrodiffusion is probed via application of AC voltage to the SPM tip and registration of resulting electrochemical strain. In this study, we implemented ESM to measure local strain in bulk LiMn2O4 cathodes of a commercial Li-battery in different states of charge to investigate distribution of Li-ion mobility and concentration. Ramped AC ESM imaging and voltage spectroscopy were used to find the most reliable regime of measurements allowing separating and diminishing different contributions to ESM. This is not a trivial task due to complex geometry of the sample and various obstacles resulting in less predictable contributions of different origins into ESM response: electrostatic tip–surface interactions, charge injection, electrostriction, and flexoelectricity. Finally, understanding and control of these contributions is an important step towards quantitative interpretation of ESM data.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); European Commission (EC), Brussels (Belgium); Government of the Russian Federation, Moscow (Russia). Ministry of Education and Science
- Grant/Contract Number:
- AC05-00OR22725; 290158; 1366.2014/236
- OSTI ID:
- 1261313
- Journal Information:
- Applied Physics Letters, Vol. 108, Issue 11; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
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