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Title: Seeing through walls at the nanoscale: Microwave microscopy of enclosed objects and processes in liquids

Journal Article · · ACS Nano
 [1];  [2];  [3];  [2];  [2]
  1. National Institute of Standards and Technology, Gaithersburg, MD (United States); Univ. of Maryland, College Park, MD (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  3. National Institute of Standards and Technology, Gaithersburg, MD (United States)

Here, noninvasive in situ nanoscale imaging in liquid environments is a current imperative in the analysis of delicate biomedical objects and electrochemical processes at reactive liquid–solid interfaces. Microwaves of a few gigahertz frequencies offer photons with energies of ≈10 μeV, which can affect neither electronic states nor chemical bonds in condensed matter. Here, we describe an implementation of scanning near-field microwave microscopy for imaging in liquids using ultrathin molecular impermeable membranes separating scanning probes from samples enclosed in environmental cells. We imaged a model electroplating reaction as well as individual live cells. Through a side-by-side comparison of the microwave imaging with scanning electron microscopy, we demonstrate the advantage of microwaves for artifact-free imaging.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1247944
Journal Information:
ACS Nano, Vol. 10, Issue 3; ISSN 1936-0851
Publisher:
American Chemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 35 works
Citation information provided by
Web of Science

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Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy journal April 2018
Anomalously low dielectric constant of confined water journal June 2018
In-situ near-field probe microscopy of plasma processing journal December 2018
Electron energy loss spectroscopy of wall charges in plasma-facing dielectrics text January 2019
Quantitative Measurements of Nanoscale Permittivity and Conductivity Using Tuning-fork-based Microwave Impedance Microscopy text January 2018
Electron energy loss spectroscopy of wall charges in plasma-facing dielectrics journal September 2019
Anomalously low dielectric constant of confined water text January 2018
Microwave Sensors for Breast Cancer Detection journal February 2018
Spatial Resolution and Capacitive Coupling in the Characterization of Nanowire Nanocomposites by Scanning Dielectric Microscopy journal July 2021
Full-wave modeling of broadband near field scanning microwave microscopy journal November 2017
Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors
  • Haenssler, Olaf C.; Fatikow, Sergej; Theron, Didier
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 36, Issue 2 https://doi.org/10.1116/1.5006161
journal March 2018