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Title: Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers

Journal Article · · Journal of Synchrotron Radiation (Online)
 [1];  [2];  [3];  [2];  [3];  [3];  [4];  [5]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  2. European X-ray Free-Electron Laser (XFEL), Hamburg (Germany)
  3. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  4. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  5. Science and Technology Facilities Council (STFC), Harwell Campus, Oxford (United Kingdom). Diamond Light Source, Ltd.

Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6 meV and 0.25 nm₋1spectral and momentum-transfer resolutions, respectively. However, further improvements down to 0.1 meV and 0.02 nm₋1are required to close the gap in energy–momentum space between high- and low-frequency probes. It is shown that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10 keV, where a combination of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a 100-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than what is possible with storage-ring-based radiation sources. Wave-optics calculations show that about 7 × 1012 photons s₋1in a 90 µeV bandwidth can be achieved on the sample. Ultimately, this will provide unique new possibilities for dynamics studies by IXS.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-06CH11357; SC0006284; SC0011237
OSTI ID:
1245210
Journal Information:
Journal of Synchrotron Radiation (Online), Vol. 23, Issue 2; ISSN 1600-5775
Publisher:
International Union of CrystallographyCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 19 works
Citation information provided by
Web of Science

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Cited By (3)

Experimental demonstration of fresh bunch self-seeding in an X-ray free electron laser journal April 2017
Photon Beam Transport and Scientific Instruments at the European XFEL journal June 2017
Preparing for High-Repetition Rate Hard X-Ray Self-Seeding at the European X-Ray Free Electron Laser: Challenges and opportunities text January 2019

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