Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
- European X-ray Free-Electron Laser (XFEL), Hamburg (Germany)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Science and Technology Facilities Council (STFC), Harwell Campus, Oxford (United Kingdom). Diamond Light Source, Ltd.
Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6 meV and 0.25 nm₋1spectral and momentum-transfer resolutions, respectively. However, further improvements down to 0.1 meV and 0.02 nm₋1are required to close the gap in energy–momentum space between high- and low-frequency probes. It is shown that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10 keV, where a combination of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a 100-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than what is possible with storage-ring-based radiation sources. Wave-optics calculations show that about 7 × 1012 photons s₋1in a 90 µeV bandwidth can be achieved on the sample. Ultimately, this will provide unique new possibilities for dynamics studies by IXS.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC02-06CH11357; SC0006284; SC0011237
- OSTI ID:
- 1245210
- Journal Information:
- Journal of Synchrotron Radiation (Online), Vol. 23, Issue 2; ISSN 1600-5775
- Publisher:
- International Union of CrystallographyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Experimental demonstration of fresh bunch self-seeding in an X-ray free electron laser
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journal | April 2017 |
Photon Beam Transport and Scientific Instruments at the European XFEL
|
journal | June 2017 |
Preparing for High-Repetition Rate Hard X-Ray Self-Seeding at the European X-Ray Free Electron Laser: Challenges and opportunities
|
text | January 2019 |
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