Gate-set tomography: calibration-free full characterization of quantum devices using error-amplifying circuits.
Conference
·
OSTI ID:1241714
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1241714
- Report Number(s):
- SAND2014-18226PE; 537846
- Resource Relation:
- Conference: Proposed for presentation at the New Horizons in Statistical Decision Theory held September 8-12, 2014 in Oberwolfach, Germany.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Gate Set Tomography (GST): Robust accurate full characterization of quantum logic gates.
Characterizing mid-circuit measurements with a new form of gate set tomography part 1: Theory.
Characterizing mid-circuit measurements with a new form of gate set tomography part 2: Experiment.
Conference
·
Mon Sep 01 00:00:00 EDT 2014
·
OSTI ID:1241714
Characterizing mid-circuit measurements with a new form of gate set tomography part 1: Theory.
Conference
·
Sat Feb 01 00:00:00 EST 2020
·
OSTI ID:1241714
+6 more
Characterizing mid-circuit measurements with a new form of gate set tomography part 2: Experiment.
Conference
·
Sat Feb 01 00:00:00 EST 2020
·
OSTI ID:1241714
+4 more