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Title: X-ray photoemission analysis of chemically modified TlBr surfaces for improved radiation detectors

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4801793· OSTI ID:1240070
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [3];  [3]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)
  3. Radiation Monitoring Devices, Watertown, MA (United States)

We subjected device-grade TlBr to various chemical treatments used in room temperature radiation detector fabrication to determine the resulting surface composition and electronic structure. As-polished TlBr was treated separately with HCl, SOCl2, Br:MeOH and HF solutions. High-resolution photoemission measurements on the valence band electronic structure and Tl 4f, Br 3d, Cl 2p and S 2p core lines were used to evaluate surface chemistry and shallow heterojunction formation. Surface chemistry and valence band electronic structure were correlated with the goal of optimizing the long-term stability and radiation response.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1240070
Report Number(s):
LLNL-JRNL-623312; JAPIAU; TRN: US1600503
Journal Information:
Journal of Applied Physics, Vol. 113, Issue 14; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

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Cited By (1)