On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging

Sopori, Bhushan; Rupnowski, Przemyslaw; Ulsh, Michael

Title: On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging

Patent · Tue Jan 12 00:00:00 EST 2016

OSTI ID:1234545

Sopori, Bhushan; Rupnowski, Przemyslaw; Ulsh, Michael

A monitoring system 100 comprising a material transport system 104 providing for the transportation of a substantially planar material 102, 107 through the monitoring zone 103 of the monitoring system 100. The system 100 also includes a line camera 106 positioned to obtain multiple line images across a width of the material 102, 107 as it is transported through the monitoring zone 103. The system 100 further includes an illumination source 108 providing for the illumination of the material 102, 107 transported through the monitoring zone 103 such that light reflected in a direction normal to the substantially planar surface of the material 102, 107 is detected by the line camera 106. A data processing system 110 is also provided in digital communication with the line camera 106. The data processing system 110 is configured to receive data output from the line camera 106 and further configured to calculate and provide substantially contemporaneous information relating to a quality parameter of the material 102, 107. Also disclosed are methods of monitoring a quality parameter of a material.

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Research Organization:: National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC36-08GO28308

Assignee:: Alliance for Sustainable Energy, LLC

Patent Number(s):: 9,234,843

Application Number:: 14/238,918

OSTI ID:: 1234545

Resource Relation:: Patent File Date: 2011 Aug 25

Country of Publication:: United States

Language:: English

References (129)

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Fuel Cell Evaluation Method And Fuel Cell Evaluation Apparatus Okuda, Hiroshi https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080150540 US Patent Application 12/068497; 20080150540	patent-application	June 2008
Interferometric Endpoint Determination in a Substrate Etching Process Lian, Lei; Davis, Matthew F. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080151237 US Patent Application 11/953853; 20080151237	patent-application	June 2008
System and Method for Fuel Cell Material X-ray Analysis Wang, Yuxin; Yun, Wenbing https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080165924 US Patent Application 11/619705; 20080165924	patent-application	July 2008
Multi-MEA test station and multi-MEA test method using the same Shin, Chan Gyun https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080197857 US Patent Application 12/014350; 20080197857	patent-application	August 2008
Apparatus For Measuring Defects In A Glass Sheet LeBlanc, Philip Robert https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080198366 US Patent Application 11/708846; 20080198366	patent-application	August 2008
Methods and Systems for Detecting Biological and Chemical Materials on a Submicron Structured Substrate Potyrailo, Radislav Alexandrovich; Barash, Eugene; Dovidenko, Katherine https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080280374 US Patent Application 11/745827; 20080280374	patent-application	November 2008
Photovoltaic Devices in Tandem Architecture Heeger, Alan J.; Lee, Kwanghee; Kim, Hin Young https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090126779 US Patent Application 11/766768; 20090126779	patent-application	May 2009
Interferometer Device and Method Kottler, Christian; Kaufmann, Rolf https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090128830 US Patent Application 12/269449; 20090128830	patent-application	May 2009
Optical Sensing System Based on a Micro-Array Structure Wang, Hong https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090180112 US Patent Application 12/014800; 20090180112	patent-application	July 2009
Measurement Apparatus, Exposure Apparatus, and Device Manufacturing Method Sasaki, Ryo https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090262323 US Patent Application 12/427645; 20090262323	patent-application	October 2009
Measuring the Shape and Thickness Variation of a Wafer with High Slopes Tang, Shouhong; Sappey, Romain https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090284734 US Patent Application 12/121250; 20090284734	patent-application	November 2009
Transparent Heat Shielding Multilayer Structure Chung, Pao-Tang; Jong, Sung-Jeng; Chen, Jer-Young https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090291295 US Patent Application 12/189932; 20090291295	patent-application	November 2009
Non-Destructive Characterization Method, Especially for Characterizing Particles of Nuclear Fuel for a High-Temperature Reactor Banchet, Julien; Tisseur, David https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090310745 US Patent Application 12/375327; 20090310745	patent-application	December 2009
Apparatus for and a Method of Determining Surface Characteristics Mansfield, Daniel Ian https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090319225 US Patent Application 12/158903; 20090319225	patent-application	December 2009
Method and Apparatus for Using Multiple Relative Reflectance Measurements to Determine Properties of a Sample Using Vacuum Ultra Violet Wavelengths Walsh, Phillip https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100171959 US Patent Application 12/592641; 20100171959	patent-application	July 2010
Three-Dimensional Shape Measuring Apparatus, Three-Dimensional Shape Measuring Method, Three-Dimensional Shape Measuring Program, and Recording Medium Mitsumoto, Daisuke; Honma, Yuki https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100195114 US Patent Application 12/670998; 20100195114	patent-application	August 2010
Automated Wafer Defect Inspection System and a Process of Performing Such Inspection O'Dell, Jeffrey; Verburgt, Thomas; Harless, Mark https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100239157 US Patent Application 12/789829; 20100239157	patent-application	September 2010
Systems for Measuring Electro-Optic and Thermo-Optic Coefficients by Using Interference Fringe Measurement, and Methods of Measuring Electro-Optic and Thermo-Optic Coefficients by Using the Systems Kim, Kyong-Hon; Lee, Seoung-Hun; Kim, Seung-Hwan https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100290055 US Patent Application 12/779236; 20100290055	patent-application	November 2010
Determining Parameters of the Dielectric Function of a Substance in Aqueous Solution by Self-Referenced Reflection THz Spectroscopy Jepsen, Peter Uhd https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100292936 US Patent Application 12/305612; 20100292936	patent-application	November 2010
Method and Apparatus for Thin Film Quality Control Finarov, Moshe; Scheiner, David; Lishzinker, Yoav https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110089348 US Patent Application 12/966595; 20110089348	patent-application	April 2011
Optical Detection Systems and Methods of Making and Using the Same Maity, Sandip; Vartak, Sameer Dinkar; Narayan Rao, Veena Besige https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110244588 US Patent Application 12/751457; 20110244588	patent-application	October 2011
Apparatus and Method for High-Speed Phase Shifting for Interferometric Measurement Systems Dillon, Robert F.; Judell, Neil H. K.; Fillion, Timothy I. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110299094 US Patent Application 13/201687; 20110299094	patent-application	December 2011
Adjustment Method, Substrate Processing Method, Substrate Processing Apparatus, Exposure Apparatus, Inspection Apparatus, Measurement and/or Inspection System, Processing Apparatus, Computer System, Program and Information Recording Medium Okita, Shinichi https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20120133913 US Patent Application 13/367671; 20120133913	patent-application	May 2012
Wide Angle Bistatic Scanning Optical Ranging Sensor Zhu, Xiang https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140078514 US Patent Application 13/880938; 20140078514	patent-application	March 2014
In Situ Optical Diagnostic for Monitoring or Control of Sodium Diffusion in Photovoltaics Manufacturing Li, Jian; Levi, Dean; Contreras, Migual https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140093985 US Patent Application 14/112033; 20140093985	patent-application	April 2014
On-Line, Continuous Monitoring in Solar Cell and Fuel Cell Manufacturing Using Spectral Reflectance Imaging Sopori, Bhushan https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140204383 US Patent Application 14/238918; 20140204383	patent-application	July 2014

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