Sandia PUF Analysis Tool
This program is a graphical user interface for measuring and performing inter-active analysis of physical unclonable functions (PUFs). It is intended for demonstration and education purposes. See license.txt for license details. The program features a PUF visualization that demonstrates how signatures differ between PUFs and how they exhibit noise over repeated measurements. A similarity scoreboard shows the user how close the current measurement is to the closest chip signatures in the database. Other metrics such as average noise and inter-chip Hamming distances are presented to the user. Randomness tests published in NIST SP 800-22 can be computed and displayed. Noise and inter-chip histograms for the sample of PUFs and repeated PUF measurements can be drawn.
- Short Name / Acronym:
- SPAT; 003219MLTPL00
- Version:
- 00
- Programming Language(s):
- Medium: X; OS: Windows, Linux, Mac OSX; Compatibility: Multiplatform
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- Contributing Organization:
- Ryan Helinski, Mitch Martin, Jason Hamlet, Bijan Fakhri, Todd Bauer
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1231948
- Country of Origin:
- United States
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