X-ray detection of transient magnetic moments induced by a spin current in Cu

Kukreja, R.; Bonetti, S.; Chen, Z.; Backes, D.; Acremann, Y.; Katine, J.; Kent, A. D.; Durr, H. A.; Ohldag, H.; Stohr, J.

doi:10.1103/PhysRevLett.115.096601

Title: X-ray detection of transient magnetic moments induced by a spin current in Cu

Journal Article · Mon Aug 24 00:00:00 EDT 2015 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.115.096601· OSTI ID:1209118

Kukreja, R. ^[1]; Bonetti, S. ^[1]; Chen, Z. ^[1]; Backes, D. ^[2]; Acremann, Y. ^[3]; Katine, J. ^[4]; Kent, A. D. ^[2]; Durr, H. A. ^[5]; Ohldag, H. ^[5]; Stohr, J. ^[5]

SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States)
New York Univ. (NYU), New York, NY (United States)
ETH Zurich, Zurich (Switzerland)
HGST, a Western Digital Company, San Jose, CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States)

We have used a MHz lock-in x-ray spectromicroscopy technique to directly detect changes in magnetic moment of Cu due to spin injection from an adjacent Co layer. The elemental and chemical specificity of x rays allows us to distinguish two spin current induced effects. We detect the creation of transient magnetic moments of 3×10^–5_μB on Cu atoms within the bulk of the 28 nm thick Cu film due to spin accumulation. The moment value is compared to predictions by Mott’s two current model. We also observe that the hybridization induced existing magnetic moments at the Cu interface atoms are transiently increased by about 10% or 4×10^–3_μB per atom. As a result, this reveals the dominance of spin-torque alignment over Joule heat induced disorder of the interfacial Cu moments during current flow.

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Research Organization:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: AC02-76SF00515

OSTI ID:: 1209118

Report Number(s):: SLAC-PUB-16331; PRLTAO; arXiv:1503.07275

Journal Information:: Physical Review Letters, Vol. 115, Issue 9; ISSN 0031-9007

Publisher:: American Physical Society (APS)

Country of Publication:: United States

Language:: English

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