Evaluation of the SEI using a multilayer spectroscopic ellipsometry model

Journal Article · Thu Aug 28 00:00:00 EDT 2014 · ECS Electrochemistry Letters

DOI:https://doi.org/10.1149/2.0031411eel· OSTI ID:1193712

Dufek, Eric J. ^[1]

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1. Idaho National Lab. (INL), Idaho Falls, ID (United States)

A multilayer spectroscopic ellipsometry (SE) model has been developed to characterize SEI formation. The model, which consists of two Cauchy layers, is constructed with an inner layer meant to model primarily inorganic compounds adjacent to an electrode and an outer layer which mirrors polymeric, organic constituents on the exterior of the SEI. Comparison of 1:1 EC:EMC and 1:4 EC:EMC with 1.0 M LiPF₆ shows distinct differences in the two modeled layers. The data suggest that the thickness of both layers change over a wide potential range. These changes have been linked with other reports on the growth of the SEI.

• Research Organization: Idaho National Lab. (INL), Idaho Falls, ID (United States)
• Sponsoring Organization: USDOE
• Grant/Contract Number: AC07-05ID14517
• OSTI ID: 1193712
• Report Number(s): INL/JOU-14-31952
• Journal Information: ECS Electrochemistry Letters, Vol. 3, Issue 11; ISSN 2162-8726
• Publisher: Electrochemical Society
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE