Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis

Sikorski, Marcin; Song, Sanghoon; Schropp, Andreas; Deutsches Elektronen-Synchrotron, Hamburg; Seiboth, Frank; Feng, Yiping; Alonso-Mori, Roberto; Chollet, Matthieu; Lemke, Henrik T.; Sokaras, Dimosthenis; Weng, Tsu-Chien; Zhang, Wenkai; Robert, Aymeric; Zhu, Diling

doi:10.1107/S1600577515004361

Title: Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis

Journal Article · Tue Apr 14 00:00:00 EDT 2015 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/S1600577515004361· OSTI ID:1189927

Sikorski, Marcin ^[1]; Song, Sanghoon ^[1]; Schropp, Andreas ^[1]; Deutsches Elektronen-Synchrotron, Hamburg ^[2]; Seiboth, Frank ^[3]; Feng, Yiping ^[1]; Alonso-Mori, Roberto ^[1]; Chollet, Matthieu ^[1]; Lemke, Henrik T. ^[1]; Sokaras, Dimosthenis ^[4]; Weng, Tsu-Chien ^[4]; Zhang, Wenkai ^[4]; Robert, Aymeric ^[4]; Zhu, Diling ^[4]

SLAC National Accelerator Laboratory, Menlo Park, CA (United States)
Germany
Technische Universitat Dresden, Dresden (Germany)
SLAC National Accelerator Lab., Menlo Park, CA (United States)

X-ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single-pulse free-electron laser beam diagnostic was tested for two typical focusing configurations. The results derived from the speckle size/shape analysis show the effectiveness of this technique in finding the focus' location, size and shape. In addition, its single-pulse compatibility enables users to capture pulse-to-pulse fluctuations in focus properties compared with other techniques that require scanning and averaging.

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Research Organization:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Contributing Organization:: Linac Coherent Light Source, SLAC National Accelerator Laboratory

OSTI ID:: 1189927

Journal Information:: Journal of Synchrotron Radiation (Online), Vol. 22, Issue 3; ISSN 1600-5775

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 14 works

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Nanofocusing of X-ray free-electron laser using wavefront-corrected multilayer focusing mirrors Matsuyama, S.; Inoue, T.; Yamada, J. Scientific Reports, Vol. 8, Issue 1 https://doi.org/10.1038/s41598-018-35611-0	journal	November 2018
Wavefront sensing at X-ray free-electron lasers Seaberg, Matthew; Cojocaru, Ruxandra; Berujon, Sebastien Journal of Synchrotron Radiation, Vol. 26, Issue 4 https://doi.org/10.1107/s1600577519005721	journal	June 2019
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Wavefront sensing at X-ray free-electron lasers Seaberg, Matthew; Cojocaru, Ruxandra; Berujon, Sebastien Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-02574	text	January 2019
Wavefront sensing at X-ray free-electron lasers Seaberg, Matthew; Cojocaru, Ruxandra; Berujon, Sebastien International Union of Crystallography (IUCr) https://doi.org/10.1107/s1600577519005721/xl5031sup1.mp4	text	January 2019

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