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Title: Controlled nanopatterning of a polymerized ionic liquid in a strong electric field

Journal Article · · Advanced Functional Materials
 [1];  [2];  [1];  [1];  [3];  [3];  [1];  [1];  [1];  [4];  [1];  [1];  [5]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Univ. of Tennessee, Knoxville, TN (United States)
  3. Hochschule Niederrhein Univ. of Applied Sciences, Krefeld (Germany)
  4. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
  5. Univ. College Dublin Belfield, Dublin (Ireland)

Nanolithography has become a driving force in advancements of the modern day's electronics, allowing for miniaturization of devices and a steady increase of the calculation, power, and storage densities. Among various nanofabrication approaches, scanning probe techniques, including atomic force microscopy (AFM), are versatile tools for creating nanoscale patterns utilizing a range of physical stimuli such as force, heat, or electric field confined to the nanoscale. In this study, the potential of using the electric field localized at the apex of an AFM tip to induce and control changes in the mechanical properties of an ion containing polymer—a polymerized ionic liquid (PolyIL)—on a very localized scale is explored. In particular, it is demonstrated that by means of AFM, one can form topographical features on the surface of PolyIL-based thin films with a significantly lower electric potential and power consumption as compared to nonconductive polymer materials. Lastly,, by tuning the applied voltage and ambient air humidity, control over dimensions of the formed structures is reproducibly achieved.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1185653
Journal Information:
Advanced Functional Materials, Vol. 25, Issue 5; ISSN 1616-301X
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 13 works
Citation information provided by
Web of Science

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Cited By (4)

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy journal September 2016
Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy journal January 2017
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review journal July 2018
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy text January 2016