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Title: Capillary discharge source

Patent ·
OSTI ID:1174599

Debris generation from an EUV electric discharge plasma source device can be significantly reduced or essentially eliminated by encasing the electrodes with dielectric or electrically insulating material so that the electrodes are shielded from the plasma, and additionally by providing a path for the radiation to exit wherein the electrodes are not exposed to the area where the radiation is collected. The device includes: (a) a body, which is made of an electrically insulating material, that defines a capillary bore that has a proximal end and a distal end and that defines at least one radiation exit; (b) a first electrode that defines a first channel that has a first inlet end that is connected to a source of gas and a first outlet end that is in communication with the capillary bore, wherein the first electrode is positioned at the distal end of the capillary bore; (c) a second electrode that defines a second channel that has a second inlet end that is in communication with the capillary bore and an outlet end, wherein the second electrode is positioned at the proximal end of the capillary bore; and (d) a source of electric potential that is connected across the first and second electrodes, wherein radiation generated within the capillary bore is emitted through the at least one radiation exit and wherein the first electrode and second electrode are shielded from the emitted radiation.

Research Organization:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
EUV LLC (Santa Clara, CA)
Patent Number(s):
6,654,446
Application Number:
09/955,658
OSTI ID:
1174599
Country of Publication:
United States
Language:
English

References (7)

Intense xenon capillary discharge extreme-ultraviolet source in the 10–16-nm-wavelength region journal January 1998
Structure and low-temperature thermal conductivity of pyrolytic boron nitride journal August 1992
Compression Annealing of Pyrolytic Boron Nitride journal March 1969
High-power plasma discharge source at 13.5 nm and 11.4 nm for EUV lithography conference June 1999
High-power extreme-ultraviolet source based on gas jets
  • Kubiak, Glenn D.; Bernardez II, Luis J.; Krenz, Kevin D.
  • 23rd Annual International Symposium on Microlithography, SPIE Proceedings https://doi.org/10.1117/12.309560
conference June 1998
Advances in the reduction and compensation of film stress in high-reflectance multilayer coatings for extreme-ultraviolet lithography conference June 1998
Intense plasma discharge source at 135 nm for extreme-ultraviolet lithography journal January 1997

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