Data preparation and evaluation techniques for x-ray diffraction microscopy

Steinbrener, Jan; Nelson, Johanna; Huang, Xiaojing; Marchesini, Stefano; Shapiro, David; Turner, Joshua J.; Jacobsen, Chris

doi:10.1364/OE.18.018598

Title: Data preparation and evaluation techniques for x-ray diffraction microscopy

Journal Article · Fri Jan 01 00:00:00 EST 2010 · Optics Express

DOI:https://doi.org/10.1364/OE.18.018598· OSTI ID:1165054

Steinbrener, Jan ^[1]; Nelson, Johanna ^[1]; Huang, Xiaojing ^[1]; Marchesini, Stefano ^[2]; Shapiro, David ^[2]; Turner, Joshua J. ^[1]; Jacobsen, Chris ^[3]

Stony Brook Univ., Stony Brook, NY (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Stony Brook Univ., Stony Brook, NY (United States); Northwestern Univ., Evanston, IL (United States); Argonne National Lab. (ANL), Argonne, IL (United States)

The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. In addition, we show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality.

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Research Organization:: Stony Brook Univ., NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: FG02-04ER46128

OSTI ID:: 1165054

Report Number(s):: DOE-RFSUNY-46128; OPEXFF

Journal Information:: Optics Express, Vol. 18, Issue 18; ISSN 1094-4087

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 22 works

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