Data preparation and evaluation techniques for x-ray diffraction microscopy
Abstract
The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. In addition, we show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality.
- Authors:
-
- Stony Brook Univ., Stony Brook, NY (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Stony Brook Univ., Stony Brook, NY (United States); Northwestern Univ., Evanston, IL (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
- Publication Date:
- Research Org.:
- Stony Brook Univ., NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1165054
- Report Number(s):
- DOE-RFSUNY-46128
Journal ID: ISSN 1094-4087; OPEXFF
- Grant/Contract Number:
- FG02-04ER46128
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Optics Express
- Additional Journal Information:
- Journal Volume: 18; Journal Issue: 18; Journal ID: ISSN 1094-4087
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; 97 MATHEMATICS AND COMPUTING
Citation Formats
Steinbrener, Jan, Nelson, Johanna, Huang, Xiaojing, Marchesini, Stefano, Shapiro, David, Turner, Joshua J., and Jacobsen, Chris. Data preparation and evaluation techniques for x-ray diffraction microscopy. United States: N. p., 2010.
Web. doi:10.1364/OE.18.018598.
Steinbrener, Jan, Nelson, Johanna, Huang, Xiaojing, Marchesini, Stefano, Shapiro, David, Turner, Joshua J., & Jacobsen, Chris. Data preparation and evaluation techniques for x-ray diffraction microscopy. United States. https://doi.org/10.1364/OE.18.018598
Steinbrener, Jan, Nelson, Johanna, Huang, Xiaojing, Marchesini, Stefano, Shapiro, David, Turner, Joshua J., and Jacobsen, Chris. 2010.
"Data preparation and evaluation techniques for x-ray diffraction microscopy". United States. https://doi.org/10.1364/OE.18.018598. https://www.osti.gov/servlets/purl/1165054.
@article{osti_1165054,
title = {Data preparation and evaluation techniques for x-ray diffraction microscopy},
author = {Steinbrener, Jan and Nelson, Johanna and Huang, Xiaojing and Marchesini, Stefano and Shapiro, David and Turner, Joshua J. and Jacobsen, Chris},
abstractNote = {The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. In addition, we show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality.},
doi = {10.1364/OE.18.018598},
url = {https://www.osti.gov/biblio/1165054},
journal = {Optics Express},
issn = {1094-4087},
number = 18,
volume = 18,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 2010},
month = {Fri Jan 01 00:00:00 EST 2010}
}
Web of Science
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