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Title: High-resolution ab initio three-dimensional x-ray diffraction microscopy

Abstract

Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.

Authors:
 [1];  [1];  [1];  [1];  [2];  [2];  [2];  [2];  [3];  [3];  [3];  [4];  [4];  [4]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  3. Arizona State Univ., Tempe, AZ (United States) Dept. Physics and Astronomy
  4. Stony Brook Univ., NY (United States) Dept. Physics and Astronomy
Publication Date:
Research Org.:
Stony Brook Univ., NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1164141
Grant/Contract Number:  
FG02-04ER46128
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
Additional Journal Information:
Journal Volume: 23; Journal Issue: 5; Journal ID: ISSN 1084-7529
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, and Shapiro, David. High-resolution ab initio three-dimensional x-ray diffraction microscopy. United States: N. p., 2006. Web. doi:10.1364/JOSAA.23.001179.
Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, & Shapiro, David. High-resolution ab initio three-dimensional x-ray diffraction microscopy. United States. https://doi.org/10.1364/JOSAA.23.001179
Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, and Shapiro, David. 2006. "High-resolution ab initio three-dimensional x-ray diffraction microscopy". United States. https://doi.org/10.1364/JOSAA.23.001179. https://www.osti.gov/servlets/purl/1164141.
@article{osti_1164141,
title = {High-resolution ab initio three-dimensional x-ray diffraction microscopy},
author = {Chapman, Henry N. and Barty, Anton and Marchesini, Stefano and Noy, Aleksandr and Hau-Riege, Stefan P. and Cui, Congwu and Howells, Malcolm R. and Rosen, Rachel and He, Haifeng and Spence, John C. H. and Weierstall, Uwe and Beetz, Tobias and Jacobsen, Chris and Shapiro, David},
abstractNote = {Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.},
doi = {10.1364/JOSAA.23.001179},
url = {https://www.osti.gov/biblio/1164141}, journal = {Journal of the Optical Society of America. A, Optics, Image Science, and Vision},
issn = {1084-7529},
number = 5,
volume = 23,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

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