High-resolution ab initio three-dimensional x-ray diffraction microscopy
Abstract
Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.
- Authors:
-
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Arizona State Univ., Tempe, AZ (United States) Dept. Physics and Astronomy
- Stony Brook Univ., NY (United States) Dept. Physics and Astronomy
- Publication Date:
- Research Org.:
- Stony Brook Univ., NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1164141
- Grant/Contract Number:
- FG02-04ER46128
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Journal of the Optical Society of America. A, Optics, Image Science, and Vision
- Additional Journal Information:
- Journal Volume: 23; Journal Issue: 5; Journal ID: ISSN 1084-7529
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY
Citation Formats
Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, and Shapiro, David. High-resolution ab initio three-dimensional x-ray diffraction microscopy. United States: N. p., 2006.
Web. doi:10.1364/JOSAA.23.001179.
Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, & Shapiro, David. High-resolution ab initio three-dimensional x-ray diffraction microscopy. United States. https://doi.org/10.1364/JOSAA.23.001179
Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, and Shapiro, David. 2006.
"High-resolution ab initio three-dimensional x-ray diffraction microscopy". United States. https://doi.org/10.1364/JOSAA.23.001179. https://www.osti.gov/servlets/purl/1164141.
@article{osti_1164141,
title = {High-resolution ab initio three-dimensional x-ray diffraction microscopy},
author = {Chapman, Henry N. and Barty, Anton and Marchesini, Stefano and Noy, Aleksandr and Hau-Riege, Stefan P. and Cui, Congwu and Howells, Malcolm R. and Rosen, Rachel and He, Haifeng and Spence, John C. H. and Weierstall, Uwe and Beetz, Tobias and Jacobsen, Chris and Shapiro, David},
abstractNote = {Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.},
doi = {10.1364/JOSAA.23.001179},
url = {https://www.osti.gov/biblio/1164141},
journal = {Journal of the Optical Society of America. A, Optics, Image Science, and Vision},
issn = {1084-7529},
number = 5,
volume = 23,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}
Web of Science
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A comprehensive simulation framework for imaging single particles and biomolecules at the European X-ray Free-Electron Laser
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Extreme ultraviolet time-resolved photoelectron spectroscopy of aqueous aniline solution: enhanced surface concentration and pump-induced space charge effect
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Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions
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High Speed and High Resolution Table-Top Nanoscale Imaging
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Three-dimensional imaging of vortex structure in a ferroelectric nanoparticle driven by an electric field
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