System and methods to determine and monitor changes in microstructural properties

Turner, Joseph A

Title: System and methods to determine and monitor changes in microstructural properties

Patent · Tue Nov 18 00:00:00 EST 2014

OSTI ID:1164038

Turner, Joseph A

A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.

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Research Organization:: Univ. of Nebraska, Lincoln, NE (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: FG02-01ER45890

Assignee:: Board of Regents of the University of Nebraska (Lincoln, NE)

Patent Number(s):: 8,887,572

Application Number:: 12/984,291

OSTI ID:: 1164038

Country of Publication:: United States

Language:: English

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Cited By (2)

System for imaging and measuring rail deflection Farritor, Shane https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9628762 US Patent Document 9,628,762	patent	April 2017
System and methods for determining structure stiffness Farritor, Shane; Lu, Sheng-Hsiao https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9347864 US Patent Document 9,347,864	patent	May 2016

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Title: System and methods to determine and monitor changes in microstructural properties

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