Basic surface chemistry and physics of carbon-based electronic materials modified by silane molecular layers
- Rutgers Univ., New Brunswick, NJ (United States)
The scope of this project is to investigate fundamental aspects of self-assembled monolayers (SAMs) grown at the surface of organic semiconductors and other electronic materials, recently discovered in our group. Understanding the growth mechanism and structure of these SAMs, as well as investigating the effect of SAM-induced high surface conductivity, are the main thrusts of the project. An additional thrust of the project is to find new ways of surface doping or surface gating of novel semiconductors, in which electronic traps at the interface would be passivated. Molecular self assembly is an exciting research area of modern materials science, playing an important role in a variety of emerging applications, such as organic and molecular electronics, bioengineering, sensors and actuators. The current effort in this field has been focused on two experimental platforms: SAMs on metals (e.g., Au) and SAMs on inorganic oxides (e.g., SiO2). We have recently discovered the third platform, molecular self-assembly at the surface of carbon-based electronic materials (organic semiconductors, graphene and CNTs), which opens new opportunities for fundamental research and applications. One of the most intriguing aspects of the new discovery is that formation of an FTS self-assembled monolayer on these materials induces a high-density mobile charges, with n up to 1014 cm-2, resulting in a large surface conductivity, σ ≈ 10-5 S·square-1. The effect is due to an interfacial electron transfer from the semiconductor to the SAM, resulting in a 0.54 V potential drop across the 1.3 nm-thick SAM, as recently revealed by Kelvin probe microscopy in rubrene.
- Research Organization:
- Rutgers Univ., New Brunswick, NJ (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- DOE Contract Number:
- SC0005464
- OSTI ID:
- 1162113
- Report Number(s):
- DOE-RUTGERS-05464-3
- Country of Publication:
- United States
- Language:
- English
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