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Title: Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy

Patent ·
OSTI ID:1159916

A method and system for performing simultaneous topographic and elemental chemical and magnetic contrast analysis in a scanning, tunneling microscope. The method and system also includes nanofabricated coaxial multilayer tips with a nanoscale conducting apex and a programmable in-situ nanomanipulator to fabricate these tips and also to rotate tips controllably.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
ACO2-06CH11357
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Number(s):
8,850,611
Application Number:
13/791,157
OSTI ID:
1159916
Country of Publication:
United States
Language:
English

References (4)

Scanning probe microscope patent December 1999
Element specific imaging by scanning tunneling microscopy combined with synchrotron radiation light journal December 2006
Collecting photoelectrons with a scanning tunneling microscope nanotip journal March 2008
Development of a scanning tunneling microscope for in situ experiments with a synchrotron radiation hard-X-ray microbeam journal February 2006

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