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Title: Rapid screening buffer layers in photovoltaics

Patent ·
OSTI ID:1157072
;

An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Number(s):
8,829,930
Application Number:
13/019,024
OSTI ID:
1157072
Country of Publication:
United States
Language:
English

References (10)

Circuit for Measuring Sheet Resistivity Including an A>C> Current Source and Average Reading D.C. Voltmeter Switch-Ably Connected to Pairs of a Four Probe Array patent July 1969
Method and Apparatus for Detecting Narrow Streaks and the Average Value of a Property Over a Relatively Wide Region Utilizing a Single Probe patent February 1970
Collinear four-point probe head and mount for resistivity measurements patent May 1983
Impedance sensing of flaws in non-homogenous materials patent February 1997
Multi-probe impedance measurement system and method for detection of flaws in conductive articles patent April 2001
Multi-element connector patent May 2006
Solar cell module and method of producing the same patent-application September 2001
Apparatus and method for near-field imaging of tissue patent-application December 2004
Silicon Thin Film Solar Cell Having Improved Underlayer Coating patent-application June 2011
Mass-Productions of Vertically Aligned Extremely Long Metallic Micro/Nanowires Using Fiber Drawing Nanomanufacturing journal April 2008

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