CRADA Final Report: Tailored Microstructures in Advanced Materials for Information Storage
A number of tunnel junctions using aluminum nitride and aluminum oxide as barriers were investigated by cross-sectional TEM using electron energy-loss spectroscopy. Kramer-Kronig analysis resulted in the ability to obtain the complete dielectric spectrum of the 1-2nm thick barrier layer. The goal of the study was to correlate the barrier dielectric properties with the performance of the tunnel junctions. The study was inconclusive.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- Materials Sciences Division
- DOE Contract Number:
- DE-AC02-05CH11231
- OSTI ID:
- 1157020
- Report Number(s):
- LBNL-6751E
- Country of Publication:
- United States
- Language:
- English
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