Data acquisition system used in radiation induced electrical degradation experiments
- Oak Ridge National Lab., TN (United States)
Radiation induced electrical degradation (RIED) of ceramic materials has recently been reported and is the topic of much research at the present time. The object of this report is to describe the data acquisition system for an experiment designed to study RIED at the High Flux Beam Reactor (HFBR) at Brookhaven National Laboratory.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- OSTI ID:
- 114946
- Report Number(s):
- DOE/ER-0313/17; ON: DE95013663; TRN: 95:022912
- Resource Relation:
- Other Information: PBD: Apr 1995; Related Information: Is Part Of Fusion materials semiannual progress report for the period ending September 30, 1994; PB: 390 p.
- Country of Publication:
- United States
- Language:
- English
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