skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Superconductive silicon nanowires using gallium beam lithography.

Technical Report ·
DOI:https://doi.org/10.2172/1147604· OSTI ID:1147604

This work was an early career LDRD investigating the idea of using a focused ion beam (FIB) to implant Ga into silicon to create embedded nanowires and/or fully suspended nanowires. The embedded Ga nanowires demonstrated electrical resistivity of 5 m-cm, conductivity down to 4 K, and acts as an Ohmic silicon contact. The suspended nanowires achieved dimensions down to 20 nm x 30 nm x 10 m with large sensitivity to pressure. These structures then performed well as Pirani gauges. Sputtered niobium was also developed in this research for use as a superconductive coating on the nanowire. Oxidation characteristics of Nb were detailed and a technique to place the Nb under tensile stress resulted in the Nb resisting bulk atmospheric oxidation for up to years.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1147604
Report Number(s):
SAND2014-0321; 498309
Country of Publication:
United States
Language:
English

Similar Records

Ga Lithography in Sputtered Niobium for Superconductive Micro and Nanowires.
Journal Article · Mon Aug 18 00:00:00 EDT 2014 · Applied Physics Letters · OSTI ID:1147604

Ga lithography in sputtered niobium for superconductive micro and nanowires
Journal Article · Mon Aug 18 00:00:00 EDT 2014 · Applied Physics Letters · OSTI ID:1147604

FABRICATION OF BISMUTH NANOWIRE DEVICES USING FOCUSED ION BEAM MILLING
Journal Article · Thu Jul 23 00:00:00 EDT 2009 · AIP Conference Proceedings · OSTI ID:1147604

Related Subjects