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Title: Radiation Effects Microscopy in Microelectronic Devices Using a Heavy Ion Nuclear Microprobe.

Conference ·
OSTI ID:1141451

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1141451
Report Number(s):
SAND2014-2545C; 506322
Resource Relation:
Conference: Proposed for presentation at the International Conference on Nuclear Microprobe Technology and Applications held July 7-11, 2014 in Padua, Italy.
Country of Publication:
United States
Language:
English