WAFER TEST CAVITY -Linking Surface Microstructure to RF Performance: a ‘Short-Sample Test Facility’ for characterizing superconducting materials for SRF cavities.
The Wafer Test cavity was designed to create a short sample test system to determine the properties of the superconducting materials and S-I-S hetero-structures. The project, funded by ARRA, was successful in accomplishing several goals to achieving a high gradient test system for SRF research and development. The project led to the design and construction of the two unique cavities that each severed unique purposes: the Wafer test Cavity and the Sapphire Test cavity. The Sapphire Cavity was constructed first to determine the properties of large single crystal sapphires in an SRF environment. The data obtained from the cavity greatly altered the design of the Wafer Cavity and provided the necessary information to ascertain the Wafer Test cavity’s performance.
- Research Organization:
- Texas A&M Research Foundation
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- SC0004928
- OSTI ID:
- 1132848
- Report Number(s):
- DOE-TAMURF-04928
- Country of Publication:
- United States
- Language:
- English
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