skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Two-axis sagittal focusing monochromator

Abstract

An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.

Inventors:
; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1130971
Patent Number(s):
8,724,776
Application Number:
13/227,517
Assignee:
Brookhaven Science Associates, LLC (Upton, NY)
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Sep 08
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Haas, Edwin G, Stelmach, Christopher, and Zhong, Zhong. Two-axis sagittal focusing monochromator. United States: N. p., 2014. Web.
Haas, Edwin G, Stelmach, Christopher, & Zhong, Zhong. Two-axis sagittal focusing monochromator. United States.
Haas, Edwin G, Stelmach, Christopher, and Zhong, Zhong. 2014. "Two-axis sagittal focusing monochromator". United States. https://www.osti.gov/servlets/purl/1130971.
@article{osti_1130971,
title = {Two-axis sagittal focusing monochromator},
author = {Haas, Edwin G and Stelmach, Christopher and Zhong, Zhong},
abstractNote = {An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.},
doi = {},
url = {https://www.osti.gov/biblio/1130971}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 13 00:00:00 EDT 2014},
month = {Tue May 13 00:00:00 EDT 2014}
}

Works referenced in this record:

Kinematic X-ray analyses apparatus
patent, January 1987


X-ray spectrometer having a doubly curved crystal
patent, August 1990


X-ray imaging crystal spectrometer for extended X-ray sources
patent, July 2001


Sagittal focusing Laue monochromator
patent, March 2009


Sagittal Focusing Laue Monochromator
patent-application, October 2008


Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending
journal, June 2003


Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies
journal, September 2001