Local bias-induced phase transitions
Journal Article
·
· Materials Today
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Asylum Research, Santa Barbara, CA (United States)
- Univ. of Aveiro, Aveiro (Portugal)
Electrical bias-induced phase transitions underpin a wide range of applications from data storage to energy generation and conversion. The mechanisms behind these transitions are often quite complex and in many cases are extremely sensitive to local defects that act as centers for local transformations or pinning. Furthermore, using ferroelectrics as an example, we review methods for probing bias-induced phase transitions and discuss the current limitations and challenges for extending the methods to field-induced phase transitions and electrochemical reactions in energy storage, biological and molecular systems.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1121200
- Journal Information:
- Materials Today, Vol. 11, Issue 11; ISSN 1369-7021
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 48 works
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