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Title: In-situ observation of xenon nanocrystals in aluminum under electron and ion irradiation in transmission electron microscope.

Abstract

In-situ ion irradiation in the transmission electron microscope (TEM) is one of the unique techniques to investigate the structural evolution of materials induced by particle bombardments. In spite of many efforts to get clear results from in-situ ion irradiation, the results were sometimes unclear because of physical and technical problems associated with TEM and ion beam hardwares. This paper describes a newly developed ion beam interface with an ultra-high voltage TEM (HVTEM) for in-situ observation of ion implantation of metals and alloys in atomic scale.

Authors:
Publication Date:
Research Org.:
Argonne National Lab., IL (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
11095
Report Number(s):
ANL/MSD/CP-97636
TRN: AH200128%%685
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Conference
Resource Relation:
Conference: 14th International Congress on Electron Microscopy, Cancun (MX), 08/31/1998--09/04/1998; Other Information: PBD: 11 Nov 1998
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALLOYS; ALUMINIUM; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; ION BEAMS; ION IMPLANTATION; IRRADIATION; XENON

Citation Formats

Furuya, K. In-situ observation of xenon nanocrystals in aluminum under electron and ion irradiation in transmission electron microscope.. United States: N. p., 1998. Web.
Furuya, K. In-situ observation of xenon nanocrystals in aluminum under electron and ion irradiation in transmission electron microscope.. United States.
Furuya, K. 1998. "In-situ observation of xenon nanocrystals in aluminum under electron and ion irradiation in transmission electron microscope.". United States. https://www.osti.gov/servlets/purl/11095.
@article{osti_11095,
title = {In-situ observation of xenon nanocrystals in aluminum under electron and ion irradiation in transmission electron microscope.},
author = {Furuya, K},
abstractNote = {In-situ ion irradiation in the transmission electron microscope (TEM) is one of the unique techniques to investigate the structural evolution of materials induced by particle bombardments. In spite of many efforts to get clear results from in-situ ion irradiation, the results were sometimes unclear because of physical and technical problems associated with TEM and ion beam hardwares. This paper describes a newly developed ion beam interface with an ultra-high voltage TEM (HVTEM) for in-situ observation of ion implantation of metals and alloys in atomic scale.},
doi = {},
url = {https://www.osti.gov/biblio/11095}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Nov 11 00:00:00 EST 1998},
month = {Wed Nov 11 00:00:00 EST 1998}
}

Conference:
Other availability
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