RF Surface Impedance Characterization of Potential New Materials for SRF-based Accelerators

Conference · Sat Sep 01 00:00:00 EDT 2012

OSTI ID:1088995

Xiao, Binping ^[1]; Eremeev, Grigory V. ^[2]; Reece, Charles E. ^[2]; Phillips, H. Lawrence ^[2]; Kelley, Michael J. ^[2]

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1. Thomas Jefferson National Accelerator Facility, Newport News, VA (United States) and College of William and Mary, Williamsburg, VA (United States)
2. Thomas Jefferson National Accelerator Facility, Newport News, VA (United States)

In the development of new superconducting materials for possible use in SRF-based accelerators, it is useful to work with small candidate samples rather than complete resonant cavities. The recently commissioned Jefferson Lab RF Surface Impedance Characterization (SIC) system can presently characterize the central region of 50 mm diameter disk samples of various materials from 2 to 40 K exposed to RF magnetic fields up to 14 mT at 7.4 GHz. We report the recent measurement results of bulk Nb, thin film Nb on Cu and sapphire substrates, Nb{sub 3}Sn sample, and thin film MgB{sub 2} on sapphire substrate provided by colleagues at JLab and Temple University.

• Research Organization: Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: AC05-06OR23177
• OSTI ID: 1088995
• Report Number(s): JLAB-ACC-12-1640; DOE/OR/23177-2336; TRN: US1300398
• Resource Relation: Conference: LINAC 12, Tel Aviv (Israel), 9-14 Sep 2012
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE